Callaghan Innovation Research Papers

Our scientists and engineers publish papers in a range of academic journals. This database provides you access to a list of their papers.

 

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Author Title [ Year(Asc)]
Filters: Author is Markwitz, A.  [Clear All Filters]
2004
Carbon depth profiling of superconducting YBCO thin films on nanometer scale, Kennedy, V.J., Markwitz A., Bubendorfer A., Long N., and Dytlewski N. , Current Applied Physics, 2004, Volume 4, Issue 2-4, p.292 - 295, (2004)
Optimization of non-fluorine sol-gel derived YBCO thin films, Long, N., Campbell L., Kemmitt T., Kennedy V.J., Markwitz A., and Bubendorfer A. , Journal of Electroceramics, 2004, Volume 13, Issue 1-3, p.361 - 365, (2004)
Photocatalytic titania coatings, Kemmitt, T., Al-Salim N.I., Waterland M., Kennedy V.J., and Markwitz A. , Current Applied Physics, 2004, Volume 4, Issue 2-4, p.189 - 192, (2004)
Quantitative study of molecular N2 trapped in disordered GaN:O films, Ruck, B.J., Koo A., Lanke U.D., Budde F., Granville S., Trodahl H.J., Bittar A., Metson J.B., Kennedy V.J., and Markwitz A. , Physical Review B - Condensed Matter and Materials Physics, 2004, Volume 70, Issue 23, p.1 - 5, (2004)
Surface smoothing of thin HTc YBa2Cu3 O7-δ superconducting films by high-energy iodine ions, Markwitz, A., Kennedy V.J., Bubendorfer A., and Long N. , Current Applied Physics, 2004, Volume 4, Issue 2-4, p.288 - 291, (2004)
2001
Effect of ion-energy on the properties of amorphous GaN films produced by ion-assisted deposition, Lanke, U., Koo A., Granville S., Trodahl J.O.E., Markwitz A., Kennedy J., and Bittar A. , Modern Physics Letters B, 2001, Volume 15, Issue 28-29, p.1355 - 1360, (2001)
Influence of the Native Oxide Layer on the Silicon Surface During Initial Stages of Nitridation, Markwitz, A., White G.V., Trompetter W.J., and Brown I.W.M. , Mikrochimica Acta, 2001, Volume 137, Issue 1-2, p.49 - 56, (2001)
Ion microscope investigations of non-uniform surfaces of thin SiO2 films produced by high-temperature nitridation experiments, Markwitz, A., Trompetter W.J., White G.V., and Brown I.W.M. , Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2001, Volume 181, Issue 1-4, p.354 - 359, (2001)
Probing for fluorine in nitrided SiO2 films by ion beam analysis, Kennedy, V.J., Markwitz A., White G.V., and Brown I.W.M. , Modern Physics Letters B, 2001, Volume 15, Issue 28-29, p.1332 - 1338, (2001)
2000
Helium ion implantation in SiAlON: Characterization of cavity structures using TEM and IBA, Johnson, P.B., Gilberd P.W., Markwitz A., Raudsepp A., and Brown I.W.M. , Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2000, Volume 166, p.121 - 127, (2000)

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