| Title | X-ray scattering characterisation of nanoparticles |
| Publication Type | Journal Article |
| Year of Publication | 2015 |
| Authors | Ingham, B. |
| Journal | Crystallography Reviews |
| Volume | 21 |
| Issue | 4 |
| Pagination | 229 - 303 |
| Date Published | 2015 |
| ISSN | 0889311X (ISSN) |
| Keywords | Distribution functions, Ex situ, High pressure study, In-situ experiments, Industrial applications, Nanomagnetics, Nanoparticles, Nanowires, Optical properties, Optoelectronic properties, Pair distribution function analysis, Resonant scattering, Sample cell, Synchrotron radiation, Synthesis (chemical), X ray diffraction, X ray scattering |
| Abstract | This article provides, in tutorial style, a review of X-ray scattering methods commonly used to characterise nanoparticles and gives numerous case studies of basic science and industrial applications right up to the present. It is divided into two major sections, broadly covering X-ray diffraction and small-angle X-ray scattering. Each section begins with a brief introduction to the technique and the information that can be obtained by using it, followed by a discussion on experimental considerations, with a particular focus on nanoparticle characterisation. The techniques and analysis methods are demonstrated by way of examples of a wide variety of nanoparticle materials and synthesis methods. Recent advances in related techniques such as anomalous scattering and pair distribution function analysis are also described and discussed. © 2015 Callaghan Innovation. |
| URL | http://www.scopus.com/inward/record.url?eid=2-s2.0-84942295107&partnerID=40&md5=67099156d1eadd9a206103b4d0b64f2a |
| DOI | 10.1080/0889311X.2015.1024114 |
