| Title | Use of IBA techniques for the measurement of oxidation processes in sialon ceramics |
| Publication Type | Journal Article |
| Year of Publication | 2001 |
| Authors | Brown, I.W.M., Barris G.C., Sheppard C.M., Trompetter W.J., and Vickridge I.C. |
| Journal | Modern Physics Letters B |
| Volume | 15 |
| Issue | 28-29 |
| Pagination | 1305 - 1313 |
| Date Published | 2001 |
| ISSN | 02179849 (ISSN) |
| Keywords | ceramic industry, conference paper, materials handling, measurement, monitoring, Oxidation, phase transition, technique, thermal analysis, X ray diffraction |
| Abstract | Sialon ceramics (Si-Al-O-N) are high performance engineering materials used as cutting tools and wear parts whose performance may be compromised by high temperature oxidation. Ion Beam Analysis (IBA) techniques, coupled with X-ray Diffraction, have been used to monitor oxidation processes in dense bodies of α/β-sialon, X-sialon and O-sialon subjected to heat treatment schedules in air to induce surface oxidation. This has permitted depth profiling of Si, Al, Y, O, & N in the sialon bodies, enabling direct comparison of oxidation resistance to be made between the different sialon compositions. |
| URL | http://www.scopus.com/inward/record.url?eid=2-s2.0-0035924735&partnerID=40&md5=e0d514fbe5436e30a93164274c7584c1 |
| DOI | 10.1142/S0217984901003202 |
