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TitleUse of IBA techniques for the measurement of oxidation processes in sialon ceramics
Publication TypeJournal Article
Year of Publication2001
AuthorsBrown, I.W.M., Barris G.C., Sheppard C.M., Trompetter W.J., and Vickridge I.C.
JournalModern Physics Letters B
Pagination1305 - 1313
Date Published2001
ISSN02179849 (ISSN)
Keywordsceramic industry, conference paper, materials handling, measurement, monitoring, Oxidation, phase transition, technique, thermal analysis, X ray diffraction
AbstractSialon ceramics (Si-Al-O-N) are high performance engineering materials used as cutting tools and wear parts whose performance may be compromised by high temperature oxidation. Ion Beam Analysis (IBA) techniques, coupled with X-ray Diffraction, have been used to monitor oxidation processes in dense bodies of α/β-sialon, X-sialon and O-sialon subjected to heat treatment schedules in air to induce surface oxidation. This has permitted depth profiling of Si, Al, Y, O, & N in the sialon bodies, enabling direct comparison of oxidation resistance to be made between the different sialon compositions.

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