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TitleUniformity of quantum efficiency of single and trap-configured silicon photodiodes
Publication TypeJournal Article
Year of Publication1993
AuthorsWhite, M.G., and Bittar A.
Pagination361 - 364
Date Published1993
ISSN00261394 (ISSN)
AbstractWe have carried out high resolution spatial measurements of the surface reflectance and responsivity of single and trap-configured silicon photodiodes at laser wavelengths between 325 nm and 780 nm. The results indicate that the spatial nonuniformity of quantum efficiency for a given photodiode varies with laser wavelength and internal structure. For radiometric quality diodes this nonuniformity of response leads to uncertainties in detector measurements which can be reduced to 0,03% or better.

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