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TitleStructure of oxidized bismuth nanoclusters
Publication TypeJournal Article
Year of Publication2007
AuthorsStevens, K.J., Ingham B., Toney M.F., Brown S.A., Partridge J., Ayesh A., and Natali F.
JournalActa Crystallographica Section B: Structural Science
Pagination569 - 576
Date Published2007
ISSN01087681 (ISSN)
Keywordsbismuth, High-resolution transmission electron microscopy, Nanoclusters, Oxidation, Oxidized bismuth nanoclusters, Peak broadening, Synchrotron radiation, Synchrotron X-ray diffraction, Transmission electron microscopy, X ray diffraction analysis
AbstractSynchrotron X-ray diffraction has determined that Β-Bi2O3 is the dominant oxide phase covering hexagonal bismuth nanoclusters produced in an inert gas aggregation source. Simulated Debye-Scherrer patterns have indicated that the oxide is 20 5 Å thick on average, at the surface of 320 40 Å diameter clusters. A Williamson-Hall analysis of the peak broadening was used to measure the non-uniform strain in clusters. The oxidized clusters were in -0.11 0.06% uniform compressive strain compared with other clusters without oxides detectable by X-ray diffraction which only have a small tensile uniform strain. High-resolution transmission electron microscopy (HRTEM) and multislice image simulations indicated a Β-Bi2O3 thickness of 20-50 Å. The HRTEM micrographs show the relative orientation between the oxide and the cluster core. © International Union of Crystallography 2007.

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