| Title | Structure of oxidized bismuth nanoclusters |
| Publication Type | Journal Article |
| Year of Publication | 2007 |
| Authors | Stevens, K.J., Ingham B., Toney M.F., Brown S.A., Partridge J., Ayesh A., and Natali F. |
| Journal | Acta Crystallographica Section B: Structural Science |
| Volume | 63 |
| Issue | 4 |
| Pagination | 569 - 576 |
| Date Published | 2007 |
| ISSN | 01087681 (ISSN) |
| Keywords | bismuth, High-resolution transmission electron microscopy, Nanoclusters, Oxidation, Oxidized bismuth nanoclusters, Peak broadening, Synchrotron radiation, Synchrotron X-ray diffraction, Transmission electron microscopy, X ray diffraction analysis |
| Abstract | Synchrotron X-ray diffraction has determined that Β-Bi2O3 is the dominant oxide phase covering hexagonal bismuth nanoclusters produced in an inert gas aggregation source. Simulated Debye-Scherrer patterns have indicated that the oxide is 20 5 Å thick on average, at the surface of 320 40 Å diameter clusters. A Williamson-Hall analysis of the peak broadening was used to measure the non-uniform strain in clusters. The oxidized clusters were in -0.11 0.06% uniform compressive strain compared with other clusters without oxides detectable by X-ray diffraction which only have a small tensile uniform strain. High-resolution transmission electron microscopy (HRTEM) and multislice image simulations indicated a Β-Bi2O3 thickness of 20-50 Å. The HRTEM micrographs show the relative orientation between the oxide and the cluster core. © International Union of Crystallography 2007. |
| URL | http://www.scopus.com/inward/record.url?eid=2-s2.0-34547150036&partnerID=40&md5=d61e7649b321faede6528aefaccd0629 |
| DOI | 10.1107/S0108768107024652 |
