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TitleIn situ synchrotron X-ray diffraction experiments on electrochemically deposited ZnO nanostructures
Publication TypeJournal Article
Year of Publication2008
AuthorsIngham, B., Illy B.N., Toney M.F., Howdyshell M.L., and Ryan M.P.
JournalJournal of Physical Chemistry C
Pagination14863 - 14866
Date Published2008
ISSN19327447 (ISSN)
KeywordsAbsorption, Absorption spectroscopy, Au substrates, Bioactivity, Deposition processing, Diffraction, Electromagnetic waves, Gold, Growth kinetics, Growth processes, In situ synchrotron X-ray diffraction, In-situ, Nanostructured films, Preferred orientation, Semiconducting zinc compounds, Spectroscopy measurements, Synchrotron radiation, Synchrotrons, X ray analysis, X ray diffraction, X ray spectroscopy, Zinc alloys, Zinc oxide, ZnO nanostructures
AbstractWe present results of in situ synchrotron X-ray diffraction experiments on electrochemically formed ZnO nanostructured films during their growth on to Au substrates. This allows the evolution of texture to be monitored throughout the deposition process. The results are in good agreement with previous in situ X-ray absorption spectroscopy measurements of growth kinetics and indicate mat strong preferred orientation, which is not evident from the microstructure, develops early in the growth process. © 2008 American Chemical Society.

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