Callaghan Innovation Research Papers

Our scientists and engineers publish papers in a range of academic journals. This database provides you access to a list of their papers.

 

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Probing for fluorine in nitrided SiO2 films by ion beam analysis, Kennedy, V.J., Markwitz A., White G.V., and Brown I.W.M. , Modern Physics Letters B, 2001, Volume 15, Issue 28-29, p.1332 - 1338, (2001)
Carbon depth profiling of superconducting YBCO thin films on nanometer scale, Kennedy, V.J., Markwitz A., Bubendorfer A., Long N., and Dytlewski N. , Current Applied Physics, 2004, Volume 4, Issue 2-4, p.292 - 295, (2004)

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