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TitleMultiple-beam interferometry with thin metal films and unsymmetrical systems
Publication TypeJournal Article
Year of Publication1989
AuthorsClarkson, M.T.
JournalJournal of Physics D: Applied Physics
Pagination475 - 482
Date Published1989
ISSN00223727 (ISSN)
KeywordsFilms--Dielectric, Interference Fringes, Interferometry, Light--Refraction, Mathematical Techniques--Numerical Analysis, Metals and Alloys--Thin Films, Multiple Beam Interferometry
AbstractNumerical calculations using the multilayer matrix method show that the interference fringes in the visible spectrum of light transmitted through two back-silvered transparent sheets separated by a dielectric film is greatly modified when a thin metal layer is present on each sheet surface. The layers cause a modulation of fringe intensity and a shift in fringe wavelength which depend on the refractive index and thickness of the layer. Fringes will be well resolved for

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