Callaghan Innovation Research Papers

Back to Research Papers

TitleMultiple-beam interferometry with thin metal films and unsymmetrical systems
Publication TypeJournal Article
Year of Publication1989
AuthorsClarkson, M.T.
JournalJournal of Physics D: Applied Physics
Volume22
Issue4
Pagination475 - 482
Date Published1989
ISSN00223727 (ISSN)
KeywordsFilms--Dielectric, Interference Fringes, Interferometry, Light--Refraction, Mathematical Techniques--Numerical Analysis, Metals and Alloys--Thin Films, Multiple Beam Interferometry
AbstractNumerical calculations using the multilayer matrix method show that the interference fringes in the visible spectrum of light transmitted through two back-silvered transparent sheets separated by a dielectric film is greatly modified when a thin metal layer is present on each sheet surface. The layers cause a modulation of fringe intensity and a shift in fringe wavelength which depend on the refractive index and thickness of the layer. Fringes will be well resolved for
URLhttp://www.scopus.com/inward/record.url?eid=2-s2.0-0024640758&partnerID=40&md5=d9ec0f24999be6ba8cfbde7da03b75b7
DOI10.1088/0022-3727/22/4/001

Back to top