| Title | Measurement uncertainties arising from unpowered shipment of dc voltage references |
| Publication Type | Conference Paper |
| Year of Publication | 2000 |
| Authors | Christian, L.A., Chua S.W., Sim T.Y., and Liu L.X. |
| Conference Name | CPEM Digest (Conference on Precision Electromagnetic Measurements) |
| Date Published | 2000 |
| Keywords | Direct current (DC) voltage reference, Hysteresis, Uncertainty measurements, Voltage measurement, Zener diodes |
| Abstract | Continuously powering the internal temperature-controlled oven provides best accuracy with Zener-diode-based dc voltage references. The hysteresis uncertainties arising from loss of power for two Fluke 732Bs are quantified. This establishes that these instruments can be shipped without battery power between national laboratories without adding significant uncertainty to a comparison. |
| URL | http://www.scopus.com/inward/record.url?eid=2-s2.0-0033712719&partnerID=40&md5=9bcc30e2bae8ece32ab196c6970aed76 |
