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TitleMeasurement uncertainties arising from unpowered shipment of dc voltage references
Publication TypeConference Paper
Year of Publication2000
AuthorsChristian, L.A., Chua S.W., Sim T.Y., and Liu L.X.
Conference NameCPEM Digest (Conference on Precision Electromagnetic Measurements)
Date Published2000
KeywordsDirect current (DC) voltage reference, Hysteresis, Uncertainty measurements, Voltage measurement, Zener diodes
AbstractContinuously powering the internal temperature-controlled oven provides best accuracy with Zener-diode-based dc voltage references. The hysteresis uncertainties arising from loss of power for two Fluke 732Bs are quantified. This establishes that these instruments can be shipped without battery power between national laboratories without adding significant uncertainty to a comparison.
URLhttp://www.scopus.com/inward/record.url?eid=2-s2.0-0033712719&partnerID=40&md5=9bcc30e2bae8ece32ab196c6970aed76

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