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TitleIon beam analysis of sialon ceramics
Publication TypeJournal Article
Year of Publication1996
AuthorsVickridge, I.C., Brown I.W.M., Ekström T.C., and Trompetter W.J.
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume118
Issue1-4
Pagination608 - 612
Date Published1996
ISSN0168583X (ISSN)
KeywordsCeramic materials, Charged particles, Chemical analysis, Deuterons, Gamma rays, High temperature properties, Ion beam analysis, Ion beams, Mechanical properties, Oxidation, Oxidation susceptibility, Sialon ceramics, Silicon aluminum oxy nitrides, Silicon compounds, Surface properties, Tribology, X rays
AbstractSialons, or silicon-aluminium-oxy-nitrides, are a family of materials that have exceptional high temperature mechanical and tribological properties, but which are susceptible to oxidation. Ion beam analysis is an ideal tool to study the composition of the altered surface layer of sialons after oxidation. In particular simultaneous detection of gamma rays, charged particles, and X-rays induced by 1.4 MeV deuterons allows an almost complete picture of the composition to be obtained.
URLhttp://www.scopus.com/inward/record.url?eid=2-s2.0-0030565169&partnerID=40&md5=82032f24df2275de11625e39a119fa21

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