| Title | Extended X-ray absorption fine structure and x-ray diffraction examination of sputtered nickel carbon binary thin films for fuel cell applications |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Ingham, B., Gaston N., Fahy K., Chin X.Y., Dotzler C.J., Rees E., Haslam G., Barber Z.H., Burstein G.T., and Ryan M.P. |
| Journal | Journal of Physical Chemistry C |
| Volume | 116 |
| Issue | 10 |
| Pagination | 6159 - 6165 |
| Date Published | 2012 |
| ISSN | 19327447 (ISSN) |
| Keywords | A-carbon, Absorption spectra, Acidic solutions, Atoms, carbon, Carbon alloys, Compositional region, Electrocatalysts, Extended X ray absorption fine structure spectroscopy, Extended X-ray absorption fine structures, Fuel cell application, Nearest-neighbors, Ni atoms, Threshold concentrations, X ray diffraction |
| Abstract | Extended X-ray absorption fine structure (EXAFS) and X-ray diffraction (XRD) are used to study the structure of sputtered binary nickel carbon alloy films (5-44 atom % Ni) for use as potential electrocatalysts in acidic solutions. Three compositional regions are identified: "low" (5 atom % Ni), where the structure consists mainly of isolated Ni atoms or dimers in a carbon matrix; "medium" (11-24 atom % Ni), where the Ni-Ni nearest-neighbor coordination is increased but there is little longer-range order; and "high" (35-44 atom % Ni), where crystalline Ni 3C is formed. This indicates a threshold concentration of Ni of between 25 and 35 at% before Ni 3C starts to form. © 2012 American Chemical Society. |
| URL | http://www.scopus.com/inward/record.url?eid=2-s2.0-84858304549&partnerID=40&md5=e39f80d1d9895881d182b9f46ee530eb |
| DOI | 10.1021/jp207308g |
