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TitleExtended X-ray absorption fine structure and x-ray diffraction examination of sputtered nickel carbon binary thin films for fuel cell applications
Publication TypeJournal Article
Year of Publication2012
AuthorsIngham, B., Gaston N., Fahy K., Chin X.Y., Dotzler C.J., Rees E., Haslam G., Barber Z.H., Burstein G.T., and Ryan M.P.
JournalJournal of Physical Chemistry C
Pagination6159 - 6165
Date Published2012
ISSN19327447 (ISSN)
KeywordsA-carbon, Absorption spectra, Acidic solutions, Atoms, carbon, Carbon alloys, Compositional region, Electrocatalysts, Extended X ray absorption fine structure spectroscopy, Extended X-ray absorption fine structures, Fuel cell application, Nearest-neighbors, Ni atoms, Threshold concentrations, X ray diffraction
AbstractExtended X-ray absorption fine structure (EXAFS) and X-ray diffraction (XRD) are used to study the structure of sputtered binary nickel carbon alloy films (5-44 atom % Ni) for use as potential electrocatalysts in acidic solutions. Three compositional regions are identified: "low" (5 atom % Ni), where the structure consists mainly of isolated Ni atoms or dimers in a carbon matrix; "medium" (11-24 atom % Ni), where the Ni-Ni nearest-neighbor coordination is increased but there is little longer-range order; and "high" (35-44 atom % Ni), where crystalline Ni 3C is formed. This indicates a threshold concentration of Ni of between 25 and 35 at% before Ni 3C starts to form. © 2012 American Chemical Society.

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