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TitleEstimating nanoparticle size from diffraction measurements
Publication TypeJournal Article
Year of Publication2000
AuthorsHall, B.D., Zanchet D., and Ugarte D.
JournalJournal of Applied Crystallography
Volume33
Issue6
Pagination1335 - 1341
Date Published2000
ISSN00218898 (ISSN)
Keywordsanalytic method, article, atomic particle, crystal structure, Fourier analysis, measurement, particle size, reliability, X ray diffraction
AbstractNanometre-sized particles are of considerable current interest because of their special size-dependent physical properties. Debye-Scherrer diffraction patterns are often used to characterize samples, as well as to probe the structure of nanoparticles. Unfortunately, the well known 'Scherrer formula' is unreliable at estimating particle size, because the assumption of an underlying crystal structure (translational symmetry) is often invalid. A simple approach is presented here which takes the Fourier transform of a Debye-Scherrer diffraction pattern. The method works well on noisy data and when only a narrow range of scattering angles is available.
URLhttp://www.scopus.com/inward/record.url?eid=2-s2.0-0034481525&partnerID=40&md5=56264dc2a0945efd0eaa941d0983be31
DOI10.1107/S0021889800010888

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