| Title | Carbon depth profiling of superconducting YBCO thin films on nanometer scale |
| Publication Type | Journal Article |
| Year of Publication | 2004 |
| Authors | Kennedy, V.J., Markwitz A., Bubendorfer A., Long N., and Dytlewski N. |
| Journal | Current Applied Physics |
| Volume | 4 |
| Issue | 2-4 |
| Pagination | 292 - 295 |
| Date Published | 2004 |
| ISSN | 15671739 (ISSN) |
| Abstract | Ion beam analysis techniques have been used to probe for carbon contamination in high temperature superconductor thin films. These techniques provide a powerful tool to detect C with limit of detection close to 0.01 at.% and to measure carbon depth profiles on the nanometer scale with a depth resolution of 10 nm at the surface. In the present study, a series of YBa2 Cu3O7-δ (YBCO) films have been formed on MgO substrates by a sol-gel method. Different film thicknesses and heat treatments were studied. Typical formation temperatures were 770-850 °C resulting in thicknesses from 50 to 600 nm. It was found that, depending on the sample preparation conditions, carbon was incorporated in the films at a concentration of 0.5-4.6 at.%. Carbon was homogeneously distributed throughout the films. © 2003 Elsevier B.V. All rights reserved. |
| URL | http://www.scopus.com/inward/record.url?eid=2-s2.0-1642293428&partnerID=40&md5=189f3a3ef26a533e6d0a7e95bc93a3d1 |
| DOI | 10.1016/j.cap.2003.11.031 |
